Resolution limits for infrared microspectroscopy explored with synchrotron radiation
Resolution limits for infrared microspectroscopy explored with synchrotron radiation
复制标题
DOI：
10.1063/1.1347965
复制
发表时间：
2001-03-01
影响因子：
1.6
通讯作者：
Carr, GL
中科院分区：
文献类型：
--
作者：
Carr, GL
研究了红外显微光谱的空间分辨率，以确定衍射或光学像差所施加的实际限制。使用高亮度同步辐射，作为衍射限制红外“点源”的显微镜，获得定量结果。所测得的分辨能力是在良好的协议与衍射理论，包括一个类似的共焦光学装置的30%的改善。衍射计算还显示了共焦设置如何导致更好的图像对比度。对于这种布置，仪器分辨率图案的半高全宽约为λ/2。当仪器的孔径定义了一个尺寸等于感兴趣的波长的区域时，就可以达到这个衍射极限。虽然商业显微光谱仪很好地校正了光学像差（允许衍射限制的结果），用于支持标本的标准基板引入色差。本文还对这种像差进行了分析，并提出了校正方法。(C)2001年美国物理学会。
The spatial resolution for infrared microspectroscopy is investigated to determine the practical limits imposed by diffraction or optical aberrations. Quantitative results are obtained using high brightness synchrotron radiation, which serves as a diffraction-limited infrared "point source" for the microscope. The measured resolving power is in good agreement with diffraction theory, including a similar to 30% improvement for a confocal optical arrangement. The diffraction calculation also shows how the confocal setup leads to better image contrast. The full width at half maximum of the instrument's resolution pattern is approximately lambda /2 for this arrangement. One achieves this diffraction limit when the instrument's apertures define a region having dimensions equal to the wavelength of interest. While commercial microspectrometers are well corrected for optical aberrations (allowing diffraction-limited results), the standard substrates used for supporting specimens introduce chromatic aberrations. An analysis of this aberration is also presented, and correction methods described. (C) 2001 American Institute of Physics.