Single-Step Deposition of Cerium-Substituted Yttrium Iron Garnet for Monolithic On-Chip Optical Isolation
Single-Step Deposition of Cerium-Substituted Yttrium Iron Garnet for Monolithic On-Chip Optical Isolation
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DOI:
10.1021/acsphotonics.5b00026
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发表时间:
2015-06
影响因子:
0.6
通讯作者:
Qingyang Du;T. Goto;Dong Hun Kim;Nicolas M. Aimon;Juejun Hu;C. Ross;Xueyin Sun;M. Onbaşlı
中科院分区:
文献类型:
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作者:
Qingyang Du;T. Goto;Dong Hun Kim;Nicolas M. Aimon;Juejun Hu;C. Ross;Xueyin Sun;M. Onbaşlı
Photonic integrated circuits require magneto-optical (MO) materials for making nonreciprocal devices such as isolators and circulators. The most successful MO materials are rare-earth-substituted iron garnets, but these can be challenging to grow on silicon without a seed layer, which introduces spacing loss between the waveguide and the MO cladding. A pulsed-laser deposition (PLD) method is used for making MO Ce:YIG (Ce1Y2Fe5O12)/YIG (Y3Fe5O12) bilayer or trilayer films on different substrates, including silicon, quartz, and Gd3Ga5O12 (GGG), in which a multilayer film is deposited in one run and then annealed. A YIG seed layer grown above the MO Ce:YIG facilitates recrystallization during ex situ rapid thermal annealing, which results in a reduced thermal budget and simplified deposition process. A monolithically integrated optical isolator was demonstrated by direct deposition of a bilayer Ce:YIG/YIG capping layer onto a silicon-on-insulator resonator. The device exhibited an insertion loss of 7.4 ± 1.8...