X-ray Holographic Microscopy using Total-Reflection Mirror Interferometer
X-ray Holographic Microscopy using Total-Reflection Mirror Interferometer
复制标题
使用全反射镜干涉仪的 X 射线全息显微镜
DOI：
10.1143/jjap.47.8595
复制
发表时间：
2008
期刊：
影响因子：
--
通讯作者：
A. Takeuchi
中科院分区：
文献类型：
--
作者：
Yoshio Suzuki;A. Takeuchi
采用菲涅耳波带片物镜透镜和全反射镜光学系统的波前分割干涉仪，研制了一套X射线全息显微光学系统。在物镜透镜的后焦平面的后方配置有平面镜，来自焦点的发散波的一半被全反射镜偏转，重叠在被摄体的放大像上。该干涉仪是在可见光光学中众所周知的劳埃德反射镜干涉仪的类似物。通过对物镜透镜进行全相干照明，成功地实现了全息显微术。利用旋转移相器的条纹扫描方法获得了定量相位图像。相位图像的空间分辨率约为200 nm，并且相位灵敏度估计在1.0 nm的X射线波长处优于λ/60。
An optical system for X-ray holographic microscopy has been developed using a Fresnel zone plate objective lens and a wavefront-dividing interferometer with total-reflection mirror optics. A plane mirror is placed behind the back focal plane of the objective lens, and half of a divergent wave from the focal point is deflected by the total-reflection mirror and overlapped onto the magnified image of the object. This interferometer is an analogue of a Lloyd's mirror interferometer, which is well known in visible light optics. By using fully coherent illumination to the objective lens, holographic microscopy was successfully performed. A quantitative phase image was obtained by the fringe scan method using a rotating phase shifter. The spatial resolution of the phase image is approximately 200 nm, and the phase sensitivity is estimated to be better than λ/60 at an X-ray wavelength of 1.0 Å.