Magnetic resonance detection and imaging using force microscope techniques (invited)
Magnetic resonance detection and imaging using force microscope techniques (invited)
复制标题
使用力显微镜技术的磁共振检测和成像（特邀）
DOI：
10.1063/1.355403
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发表时间：
1994
影响因子：
3.2
通讯作者：
D. Rugar
中科院分区：
文献类型：
--
作者：
O. Züǵer;D. Rugar
我们描述了一种新型高分辨率磁共振显微镜的原理和成像特性。磁共振是通过测量在样品中的自旋和附近的铁磁性粒子之间作用的微小振荡磁力来检测的。振荡磁力是通过极化磁场中的自旋，然后使用磁共振技术调制样品的磁化来产生的。通过感测安装样品的微机械悬臂梁的埃尺度振动来检测振荡磁力。由于磁共振光谱响应的狭窄和铁磁性颗粒产生的大磁场梯度，实现了高空间分辨率。给出的电子顺磁共振图像显示，轴向分辨率为1μm量级，横向分辨率为5μm量级。通过直接的技术改进，亚微米分辨率是可望的。
We describe the principles and imaging characteristics of a new type of high resolution magnetic resonance microscopy. Magnetic resonance is detected by measuring a small oscillating magnetic force acting between the spins in a sample and a nearby ferromagnetic particle. The oscillating magnetic force is generated by polarizing the spins in the magnetic field and then modulating the sample magnetization using magnetic resonance techniques. The oscillating magnetic force is detected by sensing the angstrom‐scale vibration of a micromechanical cantilever on which the sample is mounted. High spatial resolution is achieved as a result of the narrowness of the magnetic resonance spectral response and the large magnetic field gradient generated by the ferromagnetic particle. Electron paramagnetic resonance images are presented that demonstrate axial resolution on the order of 1 μm and lateral resolution on the order of 5 μm. Submicron resolution can be expected with straightforward technical improvements.