Real-time phase error compensation in phase sensitive scanning near-field optical microscopy.

Real-time phase error compensation in phase sensitive scanning near-field optical microscopy.
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DOI:
10.1364/ao.54.006128
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发表时间:
2015-07
期刊:
影响因子:
1.9
通讯作者:
Xiaoyue Wu;Lin Sun;Jia Wang;Qiaofeng Tan
Xiaoyue Wu;Lin Sun;Jia Wang;Qiaofeng Tan
中科院分区:
工程技术4区
文献类型:
--
作者:
Xiaoyue Wu;Lin Sun;Jia Wang;Qiaofeng Tan

文献摘要

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相位测量对于研究表面等离子体激元 (SPP) 纳米结构的光学特性至关重要。本文提出了一种基于相敏扫描近场光学显微镜(SNOM)测量系统的实时相位误差补偿方法。该方法采用共光路配置和CMR(共模抑制)原理。可以看出,相位误差补偿是实时的,主要依靠光学器件,因此不需要后处理,也不需要预先了解环境影响。讨论了相位漂移误差的原因。我们通过测量 SPP 聚焦装置来实验证明该方法的有效性。无论是漂移速度、线性度还是相位精度,与之前的相敏SNOM相比,该补偿方法都显示出很大的改进。所有测量的分布与有限差分时域(FDTD)方法获得的理论模拟非常一致。
Phase measurements are critical for investigations on the optical properties of surface plasmon polariton (SPP) nanostructures. In this paper, a real-time phase error compensation method based on a phase sensitive scanning near-field optical microscopy (SNOM) measurement system is proposed. The method adopts the common optical path configuration and CMR (common-mode rejection) principle. It can be seen that the phase error compensation is real-time and mainly relies on optical devices, therefore neither post processing nor previous knowledge of environmental effects is required. The causes of the phase drift errors are discussed. We demonstrate experimentally the effectiveness of this method by measuring a SPP focusing device. Regardless of the drift velocity, degree of linearity, or phase accuracy, the compensation method shows great improvement compared to the previous phase sensitive SNOMs. All the measured distributions are in good agreement with theoretical simulations obtained by the finite-different time-domain (FDTD) method.