3D Electron Diffraction: The Nanocrystallography Revolution
3D Electron Diffraction: The Nanocrystallography Revolution
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DOI：
10.1021/acscentsci.9b00394
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发表时间：
2019-08-28
影响因子：
18.2
通讯作者：
Abrahams, Jan Pieter
中科院分区：
文献类型：
--
作者：
Gemmi, Mauro;Mugnaioli, Enrico;Abrahams, Jan Pieter
在过去的10年里，纳米晶材料的晶体学经历了一场真正的革命，这要归功于电子衍射数据的3D采集和分析协议的引入。这种方法提供了结构解决方案和细化质量的单晶数据，允许那些迄今为止由于其有限的结晶度而未知的材料的原子结构测定。几个实验协议存在，共享的共同想法，采样的衍射图案的序列，而晶体是倾斜的非结晶轴，即，测角轴的透射电子显微镜样品台。该展望回顾了与材料和生命科学相关的不同类型样品和问题的最重要的3D电子衍射应用。包括动态散射的结构细化也进行了简要讨论。
Crystallography of nanocrystalline materials has witnessed a true revolution in the past 10 years, thanks to the introduction of protocols for 3D acquisition and analysis of electron diffraction data. This method provides single-crystal data of structure solution and refinement quality, allowing the atomic structure determination of those materials that remained hitherto unknown because of their limited crystallinity. Several experimental protocols exist, which share the common idea of sampling a sequence of diffraction patterns while the crystal is tilted around a noncrystallographic axis, namely, the goniometer axis of the transmission electron microscope sample stage. This Outlook reviews most important 3D electron diffraction applications for different kinds of samples and problematics, related with both materials and life sciences. Structure refinement including dynamical scattering is also briefly discussed.