In-situ characterization of metal clusters supported on a birefringent substrate using reflectance difference spectroscopy
In-situ characterization of metal clusters supported on a birefringent substrate using reflectance difference spectroscopy
复制标题
使用反射差光谱法对双折射基底上支撑的金属簇进行原位表征
DOI：
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
P. Zeppenfeld
中科院分区：
文献类型：
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作者：
J. M. Flores;G. Weidlinger;N. Saucedo;L. D. Sun;M. Hohage;P. Zeppenfeld
AbstractReflectance difference spectroscopy has been applied for the in-situ characterization of the growth of Ag cluster films on insulating birefringent Al2O3$(10overline{1}0)$
substrates in the spectral range of 1.5–5 eV. Information on the individual cluster, cluster film morphology and growth are derived from the anisotropy of the in-plane plasmon resonances in comparison with scanning electron microscopy images. In particular, the evolution of the dipolar resonance has been attributed to two distinct stages of coarsening involving particle aggregation and ripening, and to the development of anisotropic particle shapes for higher Ag coverages. The effect of the formation of anisotropic electrostatic images in the birefringent substrate is used to explain the spectra even in the absence of structural anisotropies.
