Quantitative Electron Microprobe Analysis of Silicates Using Energy-Dispersive X-Ray Spectrometry
Quantitative Electron Microprobe Analysis of Silicates Using Energy-Dispersive X-Ray Spectrometry
复制标题
使用能量色散 X 射线光谱法对硅酸盐进行定量电子探针分析
DOI：
10.1093/petrology/16.1.499
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发表时间：
1975
影响因子：
3.9
通讯作者：
N. Ware
中科院分区：
文献类型：
--
作者：
S. Reed;N. Ware
在微探针分析中使用锂漂移硅X射线探测器代替传统的布拉格光谱仪的优点包括操作简单和速度快。此外，由于所需的探测电流很低，电子束对矿物的损伤几乎可以消除。本文概述了定量分析的程序，并讨论了其范围和局限性，特别是硅酸盐分析。本文给出了用化学方法和常规探针分析法对34种硅酸盐进行独立分析的结果。高于约0·2wt.百分之（元素）的系统差异之间的能量分散和传统的探针结果几乎没有显着。探针和化学数据之间存在一些差异，可能主要是由于后者的误差（例如高Al2O3和低FeO）。低于0.2%但高于理论检测限的浓度有时没有记录。这被认为是由于背景的轻微过度校正，这可以通过更复杂的背景校正过程来纠正。
The advantages of using a lithium-drifted silicon X-ray detector instead of conventional Bragg spectrometers in microprobe analysis include simplicity and speed of operation. Also electron beam damage to minerals can be almost eliminated, owing to the low probe current required. A procedure for quantitative analysis is outlined here, and its scope and limitations are discussed, with special reference to silicate analysis. Analyses of 34 silicates independently analysed by chemical methods and conventional probe analysis are given. Above about 0·2 wt. per cent (element) systematic differences between energy-dispersive and conventional probe results are hardly significant. There are some discrepancies between probe and chemical data, probably mostly due to errors in the latter (e.g. high Al2O3and low FeO). Concentrations below 0·2 per cent but above the theoretical limit of detection are sometimes not recorded. This is presumed to be due to slight over-correction for background, which could be rectified by a more complicated background correction procedure.