Microstructural defects in experimentally shocked diopside: A TEM characterization
Microstructural defects in experimentally shocked diopside: A TEM characterization
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DOI:
10.1007/bf00211847
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发表时间:
1994-05
影响因子:
1.4
通讯作者:
H. Leroux;J. Doukhan;F. Langenhorst
中科院分区:
文献类型:
--
作者:
H. Leroux;J. Doukhan;F. Langenhorst
Transmission electron microscopy was used for characterizing the defect microstructure induced by shock experiments in a single crystal of diopside. The shock-induced defects found in the crystal can be divided in four distinct types:1)A high density and pervasive distribution of dislocations in glide configuration (glide systems (100)[02)Mechanical twin lamellae, mostly parallel to (100), the (001) twin lamellae are less abundant. li]3)4)Heterogeneously distributed tiny molten zones (3 to 20 μm size) which, after cooling, appear as a glass with a chemical composition very close to the one of the original diopside.The present TEM study reveals that the defect micro-structure in shocked diopside consists of a large variety of shock-induced defects. Especially, the amorphous PDFs which were never observed in statically deformed diopside seem to be an important characteristic micro-structural defects in shocked silicate minerals. Although the presence of amorphous PDFs is not yet confirmed for naturally shocked clinopyroxene, we strongly suggest that these features can serve as a diagnostic tool for recognizing impact phenomena on all planetary bodies of our solar system.