Efficient fault emulation using automatic pre-injection memory access analysis
Efficient fault emulation using automatic pre-injection memory access analysis
复制标题
使用自动预注入内存访问分析进行高效故障仿真
DOI：
--
复制
发表时间：
2012
期刊：
影响因子：
--
通讯作者：
J. Haid
中科院分区：
文献类型：
--
作者：
J. Grinschgl;Armin Krieg;C. Steger;R. Weiss;H. Bock;J. Haid
在过去的几年里，SoC的复杂性已经大大增加。这增加了针对自然外部影响和故障攻击测试SoC的努力。这些测试需要大量的时间，因为大的故障场景空间。本文提出了一种缩短系统测试时间的新方法。这种加速是通过在黄金模型运行期间观察内存访问以找到内存中的安全相关区域来实现的。因此，设计并测试了一种新型的监控模块，该模块将使用的内存地址与访问时间戳一起存储。
The complexity of SoCs has been increasing enormously over the last years. This increases the effort for testing the SoCs against natural external influences and fault attacks. These tests require a huge amount of time because of the large fault scenario space. In this paper a novel method is presented on reduction of system test duration. This speed-up is reached by observing memory accesses during a golden model run to find security relevant regions in memories. Therefore, a novel monitor module has been designed and tested which stores the used memory addresses together with the access time stamps.