Noise induced timing jitter: a general restriction for high speed RSFQ devices
Noise induced timing jitter: a general restriction for high speed RSFQ devices
复制标题
噪声引起的定时抖动：高速 RSFQ 设备的一般限制
DOI：
10.1109/tasc.2005.849830
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发表时间：
2005
影响因子：
1.8
通讯作者：
F. H. Uhlmann
中科院分区：
文献类型：
--
作者：
T. Ortlepp;F. H. Uhlmann
快速单通量量子（RSFQ）技术中的所有复杂器件都以比简单细胞可能的时钟速率低得多的时钟速率工作。新的数据驱动的自定时或异步的概念可以减少这种差距，但即使在这种情况下，模拟和实验之间仍然存在差异。在以前的研究中已经指出，RSFQ电路中的热波动的影响分为静态和动态开关位错误以及定时抖动引起的故障。比特错误率与温度呈指数关系，并且不是低温技术中的主要问题。我们最后的结果首次表明，开关时间的变化通过降低温度而缓慢地降低，并且在4.2 K时仍然很重要。我们描述了一种通用的方法来计算RSFQ小区的切换时间分布。此外，我们提出了详细的DC/SFQ转换器的时序分析结果。输出信号和输入电流斜坡之间的延迟示出了超过1 ps的变化，其超过开关时间本身的10%。这种对时序抖动背景的新理解使得RSFQ电路的设计过程能够以目标为导向进行改进。
All complex devices in rapid single flux quantum (RSFQ) technique work at much lower clock rates than possible for simple cells. New data driven self timed or asynchronous concepts can reduce this gap, but even in this case still a discrepancy between simulation and experiment is shown. It has been pointed out in previous studies, that the influence of thermal fluctuations in RSFQ circuits is divided into static and dynamic switching bit errors as well as timing jitter induced failures. The bit error rate depends exponentially on the temperature and is not the main issue in the low temperature technique. Our last results show for the first time, that the variance of the switching time is much slower decreased by reducing the temperature and is still important at 4.2 K. We describe a general method for calculating the switching time distribution for RSFQ cells. Furthermore, we present detailed results for a timing analysis of a dc/SFQ-converter. The delay between output signal and the input current ramp shows a variation over 1 ps which is more than 10% of the switching time itself. This new understanding of the background of timing jitter enables a goal-oriented improvement in the design process of RSFQ circuits.