Spectral and Angular Responses of Surface Plasmon Resonance Based on the Kretschmann Prism Configuration

Spectral and Angular Responses of Surface Plasmon Resonance Based on the Kretschmann Prism Configuration
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DOI:
10.2320/matertrans.m2010003
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发表时间:
2010-06-01
影响因子:
1.2
通讯作者:
Lee, Seong Hyuk
Lee, Seong Hyuk
中科院分区:
材料科学4区
文献类型:
--
作者:
Gwon, Hyuk Rok;Lee, Seong Hyuk

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本文研究了广泛应用于老年人生物和化学传感的Kretschmann表面等离子体共振(SPR)传感器结构的光学特性、光谱和角度响应。为了研究波干涉和薄膜的光学性质对不同入射角下反射率角变化的影响,制作了由30、52和70坚果厚度的金膜制成的Kretschmann表面等离子体共振传感器结构,并用633非He-Ne激光测量了其反射率。Theta-2 Theta旋转台,特别是硅针光电探测器。对用特征传输矩阵(CTM)方法估计的反射率的角度和光谱变化进行了数值分析,发现SPR灵敏度与金膜厚度高度相关,表明在较薄的金膜情况下,反射率在SPR角之后恢复缓慢。而随着金膜厚度的增加,在SIR角附近测得的最大反射率和最小反射率之间的幅度差小于数值分析中的其他情况。通过比较反射率、相移和由此产生的磁场强度增强的半高宽估计值,表明相移是SPR传感器最敏感的物理参数。得出的结论是,为了获得更高的灵敏度,合适的金属厚度为50 nm左右[DOI 10.2320/MATERTRANS.M2010003]
The present study investigates the optical characteristics and the spectral and angular responses of a Kretschmann surface plasmon resonance (SPR) sensor configuration that is widely used in biological and chemical sensing applications In older to examine the influence of wave interference and optical properties of thin films on angular variation of reflectance at different incident angles, the Kretschmann SPR configurations made of gold films with 30, 52, and 70 nut thicknesses were fabricated and the reflectance was detected using a 633 not He-Ne laser. theta-2 theta rotation stages, and a silicon pin photo-detector In particular. this study involved the numerical analysis of angular and spectral variation of reflectance estimated using the characteristic transmission matrix (CTM) method It was found that the SPR sensitivity became highly dependent on the gold film thickness, indicating that in the thinner gold film case, the reflectance was recovered slowly after the SPR angle. whereas as the gold film thickness increased, the magnitude difference between the maximum and the minimum reflectance measured near the SIR angle was smaller than in other cases From the numerical analysis. it was shown that the phase shift is the most sensitive physical parameter for SPR sensor by comparing estimated FWHM values of reflectance, phase shift, and enhancement of magnetic field intensity Therefore. it was concluded that an appropriate metal thickness of around 50 nm was found for higher sensitivity [doi 10.2320/matertrans.M2010003]