Finite Element Simulation of Ultrasonic Scattering by Rough Flaws with Multi-Scale Distortions.

Finite Element Simulation of Ultrasonic Scattering by Rough Flaws with Multi-Scale Distortions.
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DOI:
10.3390/ma15238633
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发表时间:
2022-12-03
期刊:
Materials (Basel, Switzerland)
影响因子:
--
通讯作者:
Li X
Li X
中科院分区:
其他
文献类型:
--
作者:
Wang Z;Zeng Z;Song Y;Li X

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缺陷表面的粗糙度对超声波的散射行为有很大的影响。了解粗糙度对缺陷回波的影响至关重要,特别是在对安全关键部件进行超声无损检测时。然而,目前的方法用于创建粗糙的缺陷模型无法重建复杂的裂纹与二次裂纹。在这里,多尺度变形方法被开发来生成一个粗糙的缺陷,通过使用一个真实的缺陷的光学显微镜图像。然后,有限元(FE)实现模拟近表面粗糙的缺陷,在镍基棒,这是由一个偏移的浸没式传感器与模式转换横波检测。数值结果表明,粗糙缺陷回波信号具有很高的随机性和复杂性。含二次裂纹的粗糙裂纹回波归一化幅度最大值与最小值之间的差距可达7.125 dB。同时,最大飞行时间(TOF)几乎是最小TOF的两倍。因此,该方法可以从宏观粗糙几何和微观粗糙表面两方面生成有效的粗糙缺陷模型。此外,粗糙缺陷表面对缺陷回波的影响超出幅度变化,并且可能使缺陷定位具有挑战性。
The roughness of a flaw’s surface significantly affects the scattering behavior of ultrasonic waves. It is vital to understand the impact of roughness on flaw echoes, especially when performing ultrasonic nondestructive inspection on safety-critical components. However, the current approach for creating rough flaw models fails to reconstruct complicated cracks with secondary cracks. Here, a multi-scale distortion method is developed to generate a rough flaw by using an optical microscope image of a real flaw. The finite element (FE) is then implemented to simulate the near-surface rough flaws in nickel-based bars, which are detected by an offsetting immersion transducer with mode-converted transverse waves. Numerical results show that the randomness and complexity of flaw echoes from rough flaws are exceptionally high. The gap between the maximum and minimum normalized amplitude values of flaw echoes from a rough crack with secondary cracks can reach 7.125 dB. Meanwhile, the maximum time of flight (TOF) is almost twice as large as the minimum TOF. Therefore, the present method can generate effective rough flaw models in terms of macroscopic rough geometry and microscopic rough surface. Moreover, the impact of the rough flaw surface on the flaw echoes goes beyond amplitude changes and may make flaw location challenging.
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