6 MeV heavy ion beam probe on the Large Helical Device
6 MeV heavy ion beam probe on the Large Helical Device
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DOI：
10.1063/1.2338311
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发表时间：
2006-10-01
影响因子：
1.6
通讯作者：
Crowley, T. P.
中科院分区：
文献类型：
--
作者：
Ido, T.;Shimizu, A.;Crowley, T. P.
在大螺旋装置（LHD）上安装了重离子束探针（HIBP）。LHD-HIBP需要一个mev范围的光束。利用串联加速器将探测光束加速到6兆电子伏。一种新型的串联电极能量分析仪也被开发出来用于分析这种高能量束。因此，可以检测到二次光束并成功地分析其能量。原理上证实，利用HIBP可以测量电位剖面。(c) 2006年美国物理研究所。
A heavy ion beam probe (HIBP) has been installed on the Large Helical Device (LHD). A MeV-range beam is required for the LHD-HIBP. The probing beam is accelerated up to 6 MeV by use of a tandem accelerator. A new energy analyzer with tandem electrodes has also been developed to analyze such a high energy beam. As a result, a secondary beam can be detected and its energy successfully analyzed. It is verified, in principle, that the potential profile can be measured using the HIBP. (c) 2006 American Institute of Physics.