Efficient reliability management in SoCs - an approximate DRAM perspective
Efficient reliability management in SoCs - an approximate DRAM perspective
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SoC 中的高效可靠性管理 - 近似 DRAM 视角
DOI：
10.1109/aspdac.2016.7428043
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
N. Wehn
中科院分区：
文献类型：
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作者：
Matthias Jung;Deepak M. Mathew;C. Weis;N. Wehn
在当今的计算系统中，动态随机存取存储器（DRAM）对性能有很大的影响，并且对总功耗有显著贡献。因此，最近的研究活动使近似DRAM的想法成为焦点，以通过降低刷新率或完全禁用刷新来节省功率并提高性能。因此，快速和准确的模型需要一个彻底的探索近似DRAM的错误弹性应用。在本文中，我们提出了一个整体的模拟环境的调查近似DRAM和错误弹性应用程序的影响。
In today's computing systems Dynamic Random Access Memories (DRAMs) have a large influence on performance and contribute significantly to the total power consumption. Thus, recent research activities bring the idea of approximate DRAM into focus to save power and improve performance by lowering the refresh rate or disabling refresh completely. Hence, fast and accurate models are required for a thoroughly exploration of approximate DRAM for error resilient applications. In this paper we present a holistic simulation environment for investigations on approximate DRAM and show the impact on error resilient applications.