75% inverse magnetoresistance at room temperature in Fe4N/MgO/CoFeB magnetic tunnel junctions fabricated on Cu underlayer
75% inverse magnetoresistance at room temperature in Fe4N/MgO/CoFeB magnetic tunnel junctions fabricated on Cu underlayer
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DOI:
10.1063/1.3072827
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发表时间:
2009-04-01
影响因子:
3.2
通讯作者:
Takahashi, Migaku
中科院分区:
文献类型:
--
作者:
Komasaki, Yosuke;Tsunoda, Masakiyo;Takahashi, Migaku
Pseudo-single-crystal Cu underlayer (UL) with thermal tolerance was obtained on bare Si wafer by employing a diffusion-blocking layer. Fe4N layer fabricated on the Cu UL has an epitaxial relationship and a large grain diameter. Magnetic tunnel junctions in a stacking sequence of Fe4N/MgO/CoFeB exhibited an inverse tunnel magnetoresistance (TMR) effect at room temperature. The largest magnitude of the TMR ratio, -75.1%, was obtained at bias voltage V-b = -250 mV, where electrons flow from CoFeB to Fe4N. The large inverse TMR ratio is due to the improvement of the crystallinity of the Fe4N film because of the small lattice misfit between Fe4N and Cu. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3072827]