Quasisaturation Effect and Optimization for 4H-SiC Trench MOSFET With P+ Shielding Region

Quasisaturation Effect and Optimization for 4H-SiC Trench MOSFET With P+ Shielding Region
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DOI:
10.1109/ted.2021.3096919
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发表时间:
2021
期刊:
IEEE Transactions on Electron Devices
影响因子:
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通讯作者:
Weifeng Sun
Weifeng Sun
中科院分区:
--
文献类型:
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作者:
Hao Fu;Jiaxing Wei;Zhaoxiang Wei;Siyang Liu;Lihua Ni;Zhuo Yang;Weifeng Sun

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