MEASUREMENT OF INTRINSIC PROPERTIES OF MATERIALS BY TIME-DOMAIN TECHNIQUES
MEASUREMENT OF INTRINSIC PROPERTIES OF MATERIALS BY TIME-DOMAIN TECHNIQUES
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DOI：
10.1109/tim.1970.4313932
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发表时间：
1970-01-01
影响因子：
5.6
通讯作者：
ROSS, GF
中科院分区：
文献类型：
--
作者：
NICOLSON, AM;ROSS, GF
本文提出了一种通过单次时域测量确定线性材料在频域中的复介电常数和复磁导率的方法;通常，频带从VHF延伸到X频带。所描述的技术涉及将未知样本放置在微波TEM模式夹具中，并用亚纳秒基带脉冲激发样本。该夹具用于分别促进前向散射能量s21（t）和后向散射能量s11（t）的测量。本文表明，前向和后向散射的时域“签名”是唯一相关的材料的固有属性，即，μ * 和μ*。通过适当地解释s21（t）和s11（t），能够确定作为频率的函数的μ和μ的真实的实部和虚部。实验结果描述了几种常见的材料。
In this paper a method is presented for determining the complex permittivity and permeability of linear materials in the frequency domain by a single time-domain measurement; typically, the frequency band extends from VHF through X band. The technique described involves placing an unknown sample in a microwave TEM-mode fixture and exciting the sample with a subnanosecond baseband pulse. The fixture is used to facilitate the measurement of the forward- and back-scattered energy, s21(t) and s11(t), respectively. It is shown in this paper that the forward- and back-scattered time-domain "signatures" are uniquely related to the intrinsic properties of the materials, namely, ϵ* and μ*. By appropriately interpreting s21(t) and s11(t), one is able to determine the real and imaginary parts of ϵ and μ as a function of frequency. Experimental results are presented describing several familiar materials.