A high resolution wire scanner for micron-size profile measurements at the SLC
A high resolution wire scanner for micron-size profile measurements at the SLC
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用于 SLC 微米尺寸轮廓测量的高分辨率线扫描仪
DOI：
10.1016/0168-9002(89)90362-8
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发表时间：
1989
期刊：
影响因子：
--
通讯作者：
W. Koska
中科院分区：
文献类型：
--
作者：
R. Fulton;J. Haggerty;R. Jared;R. Jones;J. Kadyk;C. Field;W. Kozanecki;W. Koska
在斯坦福大学直线对撞机（SLC）上，细导电纤维已被用于测量几微米的横向束尺寸。通过以小至1 μm的步长扫描光纤穿过光束，并使用电荷敏感放大器记录每个步长的二次发射信号，获得光束轮廓。我们首先概述的机械结构和模拟电子线扫描器。然后，我们描述了它的性能在测试梁和实际操作。文章最后简要讨论了这种光束轮廓监测器的性能限制。
Fine conductive fibers have been used to measure transverse beam dimensions of a few microns at the Stanford Linear Collider (SLC). The beam profile is obtained by scanning a fiber across the beam in steps as small as 1 μm, and recording the secondary emission signal at each step, using a charge sensitive amplifier. We first outline the mechanical construction and the analogue electronics of the wire scanner. We then describe its performance in test beams and in actual operation. The article closes with a brief discussion of performance limitations of such a beam profile monitor.