Logic characterization vehicle design reflection via layout rewiring
Logic characterization vehicle design reflection via layout rewiring
复制标题
通过布局重新布线反映车辆设计逻辑特征
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
R. D. Blanton
中科院分区：
文献类型：
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作者：
Phillip Fynan;Z. Liu;Ben Niewenhuis;Soumya Mittal;Marcin Strajwas;R. D. Blanton
半导体制造工艺的持续缩放使得实现成品率目标变得越来越困难。设计和制造各种类型的测试车辆是实现快速良率学习的一种方法。最近的工作介绍了卡内基梅隆逻辑表征车辆（CM-LCV）。CM-LCV设计方法使用规律性和现有的可测试性理论来产生基于逻辑的设计，这些设计具有高度的可测试性和可诊断性。为了使CM-LCV有效地用于良率学习，它必须反映实际产品布局的设计特征。以前的工作能够将来自产品设计的标准电池分布纳入LCV，同时确保最佳的可测试性。在这项工作中，提出了一种新的方法来构建一个CM-LCV，反映了产品的设计特点，通过重新布线无论是整个布局或其中的一些部分。四种不同的方法重新布线检查，并使用各种指标评估每种方法的结果。实验结果表明，产品布局可以很容易地重新布线，以合理的线长和合理的CPU时间来构建LCV。重新布线具有许多优点，包括将实际产品前端转换为基于逻辑的测试芯片，该芯片对故障具有显著的透明度。因此，这意味着来自实际产品的前端掩模可以被重新使用以创建有效的LCV，其反射性更高并且制造成本更低。
Continued scaling of semiconductor fabrication processes has made achieving yield targets increasingly difficult. The design and fabrication of various types of test vehicles is one approach for enabling fast yield learning. Recent work introduced the Carnegie Mellon logic characterization vehicle (CM-LCV). The CM-LCV design methodology uses regularity and existing testability theory to produce logic-based designs that are both highly testable and diagnosable. For the CM-LCV to be effective for yield learning, it must reflect the design characteristics of actual product layouts. Previous work enables incorporation of a standard-cell distribution derived from product designs into an LCV while simultaneously ensuring optimal testability. In this work, a new method is proposed for constructing a CM-LCV that reflects the design characteristics of a product through rewiring either the entire layout or some portion thereof. Four different approaches for rewiring are examined, and the results of each approach are evaluated using a variety of metrics. Experiment results reveal that a product layout can be easily rewired to construct an LCV with reasonable wirelength with reasonable CPU time. Rewiring has many advantages including the transformation of an actual product front-end to a logic-based test chip that has significant transparency to failure. Consequently, this means that front-end masks from an actual product can be re-used to create an effective LCV that is both more reflective and inexpensive to fabricate.