Formation of preferentially oriented Cu[111] layer on Nb[110] barrier on SiO2
Formation of preferentially oriented Cu[111] layer on Nb[110] barrier on SiO2
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DOI:
10.1143/jjap.43.l1565
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发表时间:
2004-12-15
期刊:
影响因子:
--
通讯作者:
Noya, A
中科院分区:
文献类型:
--
作者:
Maniruzzaman, M;Takeyama, MB;Noya, A
A preferentially oriented Cu [1 1 1] layer is obtained on an oriented Nb [1 1 0] barrier formed on thermally grown SiO2. We examine the characteristics of the orientation and textures in the Cu/Nb/SiO2/Si model system by X-ray diffraction analysis and cross-sectional transmission electron microscopy (TEM). It was confirmed by X-ray pole figures and omega-rocking curve measurements that the preferentially oriented Cu [1 1 1] layer in the fiber structure showing a good mosaicity with a full width at half maximum of similar to3degrees in the omega-rocking curve was grown on in oriented Nb [1 1 0] barrier. The TEM observation shows a pronounced columnar structure in the oriented Cu and Nb layers on amorphous SiO2 and the textures are stable due to annealing at 500degreesC.