Adaptive Debug and Diagnosis Without Fault Dictionaries
Adaptive Debug and Diagnosis Without Fault Dictionaries
复制标题
无需故障字典的自适应调试和诊断
DOI：
10.1007/s10836-009-5109-3
复制
发表时间：
2007
期刊：
影响因子：
--
通讯作者：
H. Wunderlich
中科院分区：
文献类型：
--
作者：
S. Holst;H. Wunderlich
诊断在现代芯片生产中是必不可少的，以提高产量，调试构成了前硅开发过程中的主要部分。对于最近的工艺技术来说，缺陷机制越来越复杂，人们不断努力通过使用复杂的故障模型来对这些缺陷进行建模。传统的基于简化故障模型的静态调试和诊断方法越来越受到限制。本文提出了一种基于组合电路的输入输出行为，不依赖于故障模型，识别组合电路中可能故障区域的方法。这种新的自适应统计方法被命名为POINTER，意为“部分重叠影响计数器”，它将灵活而强大的因果模式分析算法与高分辨率ATPG相结合。通过基准电路和工业电路的实验，我们证明了该方法的有效性。此外，即使没有额外的模式，这种分析方法也为体积诊断提供了良好的分辨率。
Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the pre-silicon development process. For recent process technologies, defect mechanisms are increasingly complex, and continuous efforts are made to model these defects by using sophisticated fault models. Traditional static approaches for debug and diagnosis with a simplified fault model are more and more limited. In this paper, a method is presented, which identifies possible faulty regions in a combinational circuit, based on its input/output behavior and independent of a fault model. The new adaptive, statistical approach is named POINTER for ‘Partially Overlapping Impact couNTER’ and combines a flexible and powerful effect-cause pattern analysis algorithm with high-resolution ATPG. We show the effectiveness of the approach through experiments with benchmark and industrial circuits. In addition, even without additional patterns this analysis method provides good resolution for volume diagnosis, too.