On Accuracy of Simplified Ray Tracing Method Compared with Rigorous Solution for Electromagnetic Wave Scattering by Two Parallel Half-Plane
On Accuracy of Simplified Ray Tracing Method Compared with Rigorous Solution for Electromagnetic Wave Scattering by Two Parallel Half-Plane
复制标题
两个平行半平面电磁波散射的简化射线追迹法与严格解的精度比较
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
K.Uchida
中科院分区：
文献类型：
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作者：
M.Nakagawa;H.Fujii;K.Uchida
