Polarization and phase-shifting interferometry for arbitrary, locally varying polarization states

Polarization and phase-shifting interferometry for arbitrary, locally varying polarization states
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DOI:
10.1364/ao.56.001422
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发表时间:
2017-02
期刊:
影响因子:
1.9
通讯作者:
S. Rothau;Christine Kellermann;S. Mayer;K. Mantel;N. Lindlein
S. Rothau;Christine Kellermann;S. Mayer;K. Mantel;N. Lindlein
中科院分区:
工程技术4区
文献类型:
--
作者:
S. Rothau;Christine Kellermann;S. Mayer;K. Mantel;N. Lindlein

文献摘要

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该出版物提出了我们认为是一种新颖的干涉方法,用于同时测量具有任意偏振的光波的相位和偏振态;特别是,它可以是变化的椭圆。测量策略基于参考波的变化,涉及相位和偏振,并处理如此获得的干涉图案。这种方法与经典的相移干涉法非常相似,可以在一个测量周期内对空间变化的偏振态及其相位波前进行全面分析。此外,可以实现关于入射光的偏振和相位的影响的不同光学元件的分析。在对该方法进行理论描述和对不同算法进行数学讨论后,给出了实现的测量装置。最后,对该方法的精度进行了讨论。
This publication presents what we believe is a novel interferometric method for the simultaneous measurement of the phase and state of polarization of a light wave with arbitrary polarization; in particular, it can be varying elliptical. The measurement strategy is based on variations of the reference wave, concerning phase and polarization and processing the interference patterns so obtained. With this method, which is very similar to classical phase-shifting interferometry, the general analysis of spatially variant states of polarization and their phase fronts can be done in one measurement cycle. Furthermore, the analysis of different optical elements regarding the impact on the polarization and phase of the incoming light can be realized. After the theoretical description of the method and the mathematical discussion of different algorithms, the realized measurement setup is presented. Afterward, the accuracy of the method is discussed.