Low-noise X-ray PIN photodiodes made of perovskite single crystals by solution-processed dopant incorporated epitaxial growth
Low-noise X-ray PIN photodiodes made of perovskite single crystals by solution-processed dopant incorporated epitaxial growth
复制标题
通过溶液处理掺杂剂外延生长由钙钛矿单晶制成的低噪声 X 射线 PIN 光电二极管
DOI:
10.1016/j.nanoen.2021.106311
复制
发表时间:
2021-07-12
期刊:
影响因子:
17.6
通讯作者:
Lei, Wei
中科院分区:
文献类型:
--
作者:
Wang, Xin;Xu, Yubing;Lei, Wei
X-ray photodiodes made of metal halide perovskites (MHPs) which directly convert X-ray photons into electron hole pairs have shown advantages in low-cost and high X-ray detection sensitivity. However, lattice-mismatched blocking layers deposited by spin-coating or evaporation cannot fully limit the dark current and noise current under large reverse bias. In this work, Solution-processed dopant incorporated epitaxial growth is employed to form sufficient blocking barriers through epitaxially growing lattice-matched n-type MHPs (bismuth-doped) and p-type MHPs (silver-doped) on opposite faces of intrinsic CH3NH3PbBr2.5Cl0.5 MHP single crystals. Through energy structure design, electron/hole blocking layers can form sufficient charges barriers, the X-ray PDs exhibit a low leakage dark current density of similar to 11 nA cm(-2) under large reverse electrical field (over 500 V cm(-1)) and noise current of 47 fAHz(-0.5) (1 mm(2), over 500 V cm(-1)). The large external electrical field enables a state-of-art response speed (fall) of 750 ns, large X-ray detection sensitivity of 36.0 mu C mGy(-1)cm(-2) and the lowest detectable dose rate of 16 nGys(-1)(40 kVp). This work will motivate new strategies to fabricate high-performance devices based on perovskites using solution-processed methods. These founding also explore a new generation of low dose and high dynamic X-ray detectors based on MHPs.