Reduction of electrical conductivity in Ag nanowires induced by low-energy electron beam irradiation
Reduction of electrical conductivity in Ag nanowires induced by low-energy electron beam irradiation
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DOI：
10.1016/j.jpcs.2018.09.009
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发表时间：
2019-01
影响因子：
4
通讯作者：
Jianli Wang;C. Mao;Zhizheng Wu;Wei Xi;Yunfeng Zhao;R. Xia;Juekuan Yang;Yunfei Chen
中科院分区：
文献类型：
--
作者：
Jianli Wang;C. Mao;Zhizheng Wu;Wei Xi;Yunfeng Zhao;R. Xia;Juekuan Yang;Yunfei Chen
人们普遍认为，在扫描电子显微镜内的原位成像和焊接过程中，低能电子束（e-beam）辐照对金属纳米结构的物理性能的影响可以忽略不计。在这里，通过使用电子束诱导沉积纳米光刻接触末端后，银纳米线的电导率显着降低。在透射电子显微镜下观察到纳米线内部生动的晶体缺陷迁移，揭示电子束引起的内应力为电导率显着下降提供了解释。这些观察结果表明电子束暴露会导致银纳米线内部的异常形态变化。此外，电导率提供了监测相关纳米结构变化的有效策略。
It is generally accepted that the low-energy electron beam (e-beam) irradiation has a negligible effect on the physical properties of metallic nanostructures during the in-situ imaging and welding inside the scanning electron microscope. Here, a pronounced decrease in the electrical conductivity of Ag nanowires is obtained after contacting the ends by using the e-beam induced deposition nanolithography. A vivid crystal defect migration inside nanowire is observed under the transmission electron microscope, revealing that the e-beam induced internal stress provides an explanation for the remarkable conductivity decrease. These observations indicate that e-beam exposure can cause anomalous morphology change inside Ag nanowire. In addition, the electrical conductivity provides an effective strategy to monitor the related nanostructure change.