Hole spin relaxation in Ge-Si core-shell nanowire qubits
Hole spin relaxation in Ge-Si core-shell nanowire qubits
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DOI:
10.1038/nnano.2011.234
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发表时间:
2012-01-01
影响因子:
38.3
通讯作者:
Marcus, Charles M.
中科院分区:
文献类型:
--
作者:
Hu, Yongjie;Kuemmeth, Ferdinand;Marcus, Charles M.
Controlling decoherence is the biggest challenge in efforts to develop quantum information hardware(1-3). Single electron spins in gallium arsenide are a leading candidate among implementations of solid-state quantum bits, but their strong coupling to nuclear spins produces high decoherence rates(4-6). Group IV semiconductors, on the other hand, have relatively low nuclear spin densities, making them an attractive platform for spin quantum bits. However, device fabrication remains a challenge, particularly with respect to the control of materials and interfaces(7). Here, we demonstrate state preparation, pulsed gate control and charge-sensing spin readout of hole spins confined in a Ge-Si core-shell nanowire. With fast gating, we measure T-1 spin relaxation times of up to 0.6 ms in coupled quantum dots at zero magnetic field. Relaxation time increases as the magnetic field is reduced, which is consistent with a spin-orbit mechanism that is usually masked by hyperfine contributions.