Three-dimensional shape measurement with binary dithered patterns
Three-dimensional shape measurement with binary dithered patterns
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DOI：
10.1364/ao.51.006631
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发表时间：
2012-09-20
期刊：
影响因子：
1.9
通讯作者：
Zhang, Song
中科院分区：
文献类型：
--
作者：
Wang, Yajun;Zhang, Song
先前提出的二元离焦技术及其变体已被证明在条纹较窄时能够成功地测量高质量的三维（3D）形状，但在条纹较宽时则会受到影响。本文提出利用二值抖动技术来克服这一挑战。仿真和实验结果均表明，在条纹较宽且投影器接近聚焦的情况下，相位误差始终小于0.6%。(C) 2012美国光学学会
The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused. (C) 2012 Optical Society of America