Quality factor for localized defect modes in a photonic crystal slab upon a low-index dielectric substrate.
Quality factor for localized defect modes in a photonic crystal slab upon a low-index dielectric substrate.
复制标题
DOI：
10.1364/ol.26.000740
复制
发表时间：
2001-05
期刊：
影响因子：
3.6
通讯作者：
E. Miyai;K. Sakoda
中科院分区：
文献类型：
--
作者：
E. Miyai;K. Sakoda
采用时域有限差分法对SiO（2）基片上二维光子晶体平板中的缺陷模进行了数值模拟。在偶极辐射谱的赝隙中发现了E（1）空间对称缺陷模的简并对。通过优化样品的几何形状，我们实现了高达800的品质因数。
Localized defect modes in a two-dimensional photonic crystal slab upon a SiO(2) substrate have been analyzed by a numerical simulation of dipole radiation based on the finite-difference time-domain method. A degenerate pair of the defect mode of E(1) spatial symmetry was found in a pseudogap in the spectrum of dipole radiation. We achieved a quality factor as large as 800 by optimizing the sample geometry.