A transmission electron microscope study of commercial X7R-type multilayer ceramic capacitors
A transmission electron microscope study of commercial X7R-type multilayer ceramic capacitors
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DOI:
10.1016/s0955-2219(97)00184-2
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发表时间:
1998
影响因子:
5.7
通讯作者:
F. Azough;R. AL-Saffar;R. Freer
中科院分区:
文献类型:
--
作者:
F. Azough;R. AL-Saffar;R. Freer
X7R-type multilayer ceramic capacitors produced by three commercial manufacturers (A, B and C) have been investigated by transmission electron microscopy. All the specimens contained grains with distinct core-shell structures; the cores were almost pure BaTiO3and exhibited domain structures at room temperature. Specimens of type A had a grain size of 1–2μm, with ‘wide’ shells containing Pb, Bi, Nb, Ba and Ti. A bonding phase, rich in Si, Al, Ba and Ti was detected between the dielectric grains and Ag-Pd electrodes. Heating the samples to temperatures above 130 °C caused the ferroelectric domain structure to be lost and replaced by a dislocation network. Specimens of type B and C had a grain size of 0.5–1.0 μm; the ferroelectric cores were surrounded by ‘narrow’ shells rich in Nb, Co, Ba and Ti. The Ag-Pd internal electrodes were twinned. Type I and type II core-shell structures were found in all three sets of multilayer ceramic capacitors.