New diamond anvil cell for single-crystal analysis

New diamond anvil cell for single-crystal analysis
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用于单晶分析的新型金刚石砧座

DOI:
10.1063/1.1336821
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发表时间:
2001
影响因子:
1.6
通讯作者:
H. Sumiya
H. Sumiya
中科院分区:
工程技术4区
文献类型:
--
作者:
T. Yamanaka;T. Fukuda;T. Hattori;H. Sumiya

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设计了一种新的金刚石对顶砧装置,用于高压下的单晶结构分析。该单元的特点是大单晶金刚石板,用于窗口和固定在金刚石砧的台面上。金刚石板窗口对于单晶衍射具有很大的优势,例如低X射线吸收,高达50 GPa的高得多的压力,窗口没有粉末环,以及宽2θ角(2θ<70°)。与同步辐射技术相结合,可以使结构分析取得很大进展。用SPring-8上8 GeV 100 mA的SR源的短波长λ= 0.40772A(E= 30.388keV)测量了金红石型SiO2方石英的衍射强度。  这些优点可以测量更高阶反射的强度,并讨论了精确的电子密度分布作为压力的函数。
A new diamond anvil cell was devised for the single-crystal structure analyses under high pressure. The cell is characterized by large single-crystal diamond plates, which are used for the windows and fixed on the table planes of diamond anvils. The diamond plate windows have great advantages for single-crystal diffractometry, such as low x-ray absorption, much higher pressures up to 50 GPa, no powder rings from the window, and wide 2θ-angle (2θ<70°). Great progress of the structure analyses could be made by the combination with synchrotron radiation (SR). The short wavelength of λ=0.407 72 A (E=30.388 keV) of SR source with 8 GeV 100 mA at SPring-8 was used for the diffraction intensity measurement of SiO2 stishovite (rutile type). These advantages could measure the intensities of much higher order reflections and the precise electron density distribution as a function of pressure was discussed.
DOI: 10.1029/jb091ib05p04673
发表时间: 1986-04-10
期刊: JOURNAL OF GEOPHYSICAL RESEARCH-SOLID EARTH AND PLANETS
影响因子: --
作者:
MAO, HK;XU, J;BELL, PM
通讯作者: BELL, PM