Annealing effects on the properties of indium tin oxide films coated on soda lime glasses with a barrier layer of TiO2-SiO2 composite films
Annealing effects on the properties of indium tin oxide films coated on soda lime glasses with a barrier layer of TiO2-SiO2 composite films
复制标题
退火对TiO2-SiO2复合薄膜阻挡层钠钙玻璃上氧化铟锡薄膜性能的影响
DOI：
10.1117/1.601461
复制
发表时间：
1997
影响因子：
1.3
通讯作者：
M. Hua
中科院分区：
文献类型：
--
作者：
R. Tsai;F. Ho;M. Hua
何芳忠工业技术研究所光电与系统实验室大楼中兴路195-8号51室秒4竹东，台湾31015电子邮件：ryt111@oes.伊特里.org.twMu-Yi Hua国立清华大学化学工程系台湾新竹摘要。在有和没有TiO阻挡层的钠钙玻璃上涂覆的铟锡氧化物（ITO）薄膜的结构、光学和电学性质
Fang-Chung HoIndustrial Technology Research InstituteOpto-Electronics and Systems LaboratoriesBldg. 51, 195-8 Chung Hsing Rd.,Sec. 4Chutung, Taiwan 31015E-mail: ryt111@oes.itri.org.twMu-Yi HuaNational Tsing Hua UniversityChemical Engineering DepartmentHsingchu, TaiwanAbstract. The structural, optical, and electrical properties of indium tinoxide (ITO) films coated on soda lime glasses with and without a barrierlayer of TiO