Structure and Raman scattering study on Ba8GaxSi46−x (x=10 and 16) type I clathrates
Structure and Raman scattering study on Ba8GaxSi46−x (x=10 and 16) type I clathrates
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Ba8GaxSi46−x (x=10 和 16) I 型包合物的结构和拉曼散射研究
DOI:
10.1016/j.jssc.2004.01.011
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发表时间:
2004
影响因子:
3.3
通讯作者:
J. Nagao
中科院分区:
文献类型:
--
作者:
D. Nataraj;J. Nagao
Structure and vibrational properties of Ba{sub 8}Ga{sub x}Si{sub 46-x} (x=10 and 16) clathrates were studied by X-ray diffraction and Raman scattering measurements. The temperature dependent electrical resistivity measurement on Ba{sub 8}Ga{sub 10}Si{sub 36} has shown semiconducting nature of that clathrate with an energy band gap value of 0.31 eV. On the other hand the measurement on Ba{sub 8}Ga{sub 16}Si{sub 30} has shown metallic like electrical conductivity of that clathrate. The origin of semiconductivity in Ba{sub 8}Ga{sub 10}Si{sub 36} was found to be due to the vacancy disorder in the framework sites. Room temperature Raman scattering measurements resolved several Raman vibrational modes, including low frequencies ones corresponding to the rattling motion of Ba atoms. The low frequency positions of Ba in the respective clathrates at 49.4, 73.7 and 97.3 cm{sup -1} for Ba{sub 8}Ga{sub 10}Si{sub 36} and at 43.7, 74.5 and 92.4 cm{sup -1} for Ba{sub 8}Ga{sub 16}Si{sub 30} were found to be in agreement with the reported density functional (DF) calculated low frequency modes of Ba{sub 8}Ga{sub 16}Si{sub 30}. The framework gallium difference and vacancy disorders were found to influence the position and widths of frequency modes. Room temperature lattice thermal conductivity of Ba{sub 8}Ga{sub 10}Si{sub 36} and Ba{sub 8}Ga{sub 16}Si{sub 30} were 1.128 and 1.071 Wm{sup -1} K{sup -1}, respectively, and this low value was attributed to the resonant scattering between the framework acoustic and Ba rattling modes.