Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers
Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers
复制标题
过渡金属多层膜的共振磁X射线和中子扩散研究
DOI：
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
B. Hickey
中科院分区：
文献类型：
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作者：
T. Hase;J. Buchanan;B. Tanner;S. Langridge;R. Dalgliesh;S. Foster;C. Marrows;B. Hickey
金属多层膜内的电子散射机制受到结构和磁性无序的影响。非镜面X射线散射长期以来一直被用于探测结构界面，直到最近才被应用于磁无序的研究。我们比较的共振磁x射线散射与离镜面中子研究磁控溅射的Co/Cu和Co/Ru多层膜生长在第二个反铁磁耦合峰。这两种技术产生类似的结果为铜系统，和一个简单的域模型可以应用于提取磁界面形态参数。对于Cu系统，面内关联长度与场有关，沿着难磁化轴饱和后为880±20 A，而沿沿着正交易磁化轴饱和后为7000±100 A.这两个系统都表现出很强的平面外的相关性，在结构和磁性的障碍。在所有情况下，结构界面的面外相关长度为200-25...
Electron scattering mechanisms within metallic multilayers are affected by both structural and magnetic disorders. Off-specular x-ray scattering has long been used to probe the structural interfaces, and it is only recently that it has been applied to the study of magnetic disorder. We compare the resonant magnetic x-ray scattering with off-specular neutron studies from magnetron-sputtered Co/Cu and Co/Ru multilayers grown at the second antiferromagnetic coupling peak. Both techniques yield similar results for the Cu system, and a simple domain model can be applied to extract the magnetic interface morphological parameters. For the Cu system, the in-plane correlation length is field dependent and is 880±20 A after saturation along the hard axis, but increases to 7000±100 A after saturation along the orthogonal easy axis. Both systems show strong out-of-plane correlations in both the structural and magnetic disorders. In all cases, the out-of-plane correlation length for the structural interfaces is 200–25...