The intercalation of Ar into C_60 films
The intercalation of Ar into C_60 films
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Ar嵌入C_60薄膜中
DOI：
10.1557/jmr.1997.0001
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发表时间：
1997
期刊：
影响因子：
--
通讯作者：
M. James
中科院分区：
文献类型：
--
作者：
G. E. Gadd;P. Evans;S. Moricca;M. James
在这篇通讯中，我们讨论了未注入和注入的C_60薄膜(Y和Au注入)在Ar气压170 Mpa(1.7kbar)、温度300或400℃下热等静压(HIPed)时，如何显示出大量的Ar吸收到薄膜中。卢瑟福背散射提供了一种解释薄膜成分的有效方法，表明薄膜的∼为1.5at.%Ar，与接近Ar_1C_60的化学计量比一致。当薄膜在300°C的真空中保持时，Ar被发现从薄膜中扩散，随后可以通过重新HIPing重新结合到薄膜中，并吸收类似数量的Ar。红外光谱表明，在300℃加热过程中，Ar的吸收和随后的损失过程中，C60的红外吸收保持不变。这表明Ar是以间隙形式捕获在C60笼外的薄膜中的。
In this Communication we discuss how unimplanted and implanted films (Y and Au implanted) of C_60, when hot isostatically pressed (HIPed) at a pressure of 170 MPa (1.7 kbar) of Ar and temperatures of 300 or 400 °C, show substantial uptake of Ar into the film. Rutherford backscattering (RBS) provides an effective method for elucidating film composition, showing the films to have ∼1.5 at.% of Ar, consistent with a stoichiometry close to Ar_1 C_60. The Ar was found to diffuse from the films when these were held in a vacuum at 300 °C. It could subsequently be reincorporated into the film by re-HIPing, with uptake of a similar amount of Ar. IR spectroscopy showed that the C_60 IR absorptions remain unchanged throughout uptake of the Ar and its subsequent loss during heating at 300 °C. It appears that the Ar is trapped interstitially in the films outside the C_60 cages.