Reconfigurable ECC for adaptive protection of memory
Reconfigurable ECC for adaptive protection of memory
复制标题
用于内存自适应保护的可重新配置 ECC
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
S. Bhunia
中科院分区：
文献类型：
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作者：
A. Basak;Somnath Paul;Jangwon Park;Jongsun Park;S. Bhunia
依赖于内置冗余（例如，行/列冗余）的硅后修复技术在修复纳米级存储器中的制造缺陷和工艺变化引起的故障方面仍然有效。然而，它们在提高各种运行时故障下的鲁棒性方面并不有效。存储器中运行时故障的增加，特别是在低电压低功率存储器的情况下，已经成为主要的设计挑战。传统上，使用纠错码（ECC）的统一最坏情况保护用于大型存储器阵列中的所有块以用于运行时错误恢复。然而，在存储器块的固有可靠性的空间和时间移位的情况下，这样的统一保护在ECC开销或保护级别方面可能是没有吸引力的。我们提出了一种新的可重构ECC方法，它可以适应，在空间和时间上，通过使用ECC，可以提供适量的保护，在给定的时间为一个内存块的内存块的不同的可靠性。我们表明，这种方法是非常有效的，在不同的应用程序。
Post-silicon healing techniques that rely on built-in redundancy (e.g. row/column redundancy) remain effective in healing manufacturing defects and process variation induced failures in nanoscale memory. They are, however, not effective in improving robustness under various run-time failures. Increasing run-time failures in memory, specifically in case of low-voltage low-power memory, has emerged as a major design challenge. Traditionally, a uniform worst-case protection using Error Correction Code (ECC) is used for all blocks in a large memory array for runt-time error resiliency. However, with both spatial and temporal shift in intrinsic reliability of a memory block, such uniform protection can be unattractive in terms of either ECC overhead or protection level. We propose a novel Reconfigurable ECC approach, which can adapt, in space and time, to varying reliability of memory blocks by using an ECC that can provide the right amount of protection for a memory block at a given time. We show that such an approach is extremely effective in diverse applications.