Comprehensive assessment of RRAM-based PUF for hardware security applications

Comprehensive assessment of RRAM-based PUF for hardware security applications
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DOI:
10.1109/iedm.2015.7409672
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发表时间:
2015-12
期刊:
2015 IEEE International Electron Devices Meeting (IEDM)
影响因子:
--
通讯作者:
An Chen
An Chen
中科院分区:
其他
文献类型:
--
作者:
An Chen

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电阻式随机存取存储器(RRAM)的随机行为和固有可变性可用于实现用于硬件安全应用的物理不可克隆功能(PUF)。RRAM PUF的性能取决于RRAM器件特性。RRAM PUF的可靠性可随着保持损失、读取不稳定性和热变化而降级,而只要保持RRAM电阻分布中的随机性,就维持PUF唯一性。基于关键的PUF指标,本文提出了一种系统的方法,全面评估这种新的应用RRAM。
The stochastic behavior and intrinsic variability of resistive random access memory (RRAM) can be utilized to implement physical unclonable function (PUF) for hardware security applications. Performance of RRAM PUF depends on RRAM device characteristics. Reliability of RRAM PUF may degrade with retention loss, read instability and thermal variation, while PUF uniqueness is maintained as long as the randomness in RRAM resistance distribution is preserved. Based on key PUF metrics, this paper presents a systematic approach for a comprehensive evaluation of this novel application of RRAM.