Current-Voltage Characteristics of Silver Nanocontact Studied by In situ Transmission Electron Microscopy
Current-Voltage Characteristics of Silver Nanocontact Studied by In situ Transmission Electron Microscopy
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原位透射电子显微镜研究银纳米触点的电流-电压特性
DOI：
10.1143/jpsj.81.114707
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发表时间：
2012
影响因子：
1.7
通讯作者：
Hideki Masuda and Tokushi Kizuka
中科院分区：
文献类型：
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作者：
Tokushi Kizuka;Kun'ichi Miyazawa;and Takayuki Tokumine;Yoshinori Nishino;西野吉則;Hideki Masuda and Tokushi Kizuka
银纳米接触（NC）是通过在室温下在配备有两个压电驱动测角仪台的透射电子显微镜内接触两个银纳米尖端来产生的。在拉伸变形过程中，使用压电元件，同时施加交变偏置电压的NC变薄。在动态图像观察过程中，测量偏置电压、电流、NC的电导、力和作用于NC的应力的变化。分析了不同接触宽度的纳米碳的原子构型。的电流-电压特性进行了研究，为每种配置。因此，本研究表明，接触结构和导电的NC之间的关系;的非线性的电流-电压曲线增加的NC减薄。
Silver (Ag) nanocontacts (NCs) were produced by the contact of two Ag nanotips at room temperature inside a transmission electron microscope equipped with two piezodriven goniometer stages. The NCs were thinned during tensile deformation using piezoelements while applying alternating bias voltage. The variations in the bias voltage, current, conductance of the NCs, force, and stress acting on the NCs were measured during dynamic image observation. The atomic configurations of the NCs with various contact widths were analyzed. The current–voltage characteristics were investigated for each configuration. As a result, the present study demonstrated the relationship between the contact structure and the conduction of the NCs; the nonlinearity of the current–voltage curves increased as the NCs were thinned.