Keisuke Tanaka: "X-Ray Measurement of Residual Stress on TiC Coatings by CVD Method" Proceedings of Inter.Symp.Nondestructive Testing and Stress-Strain Measurement. 2. 401-411 (1992)

Keisuke Tanaka: "X-Ray Measurement of Residual Stress on TiC Coatings by CVD Method" Proceedings of Inter.Symp.Nondestructive Testing and Stress-Strain Measurement. 2. 401-411 (1992)
复制标题

Keisuke Tanaka:“通过 CVD 方法对 TiC 涂层上的残余应力进行 X 射线测量”Inter.Symp.无损检测和应力应变测量论文集。

DOI:
--
复制
发表时间:
--
期刊:
影响因子:
--
通讯作者:
--
中科院分区:
--
文献类型:
--
作者:

文献摘要

相似文献