First observation of He22+: charge stripping of He2+ using a double-focusing mass spectrometer
First observation of He22+: charge stripping of He2+ using a double-focusing mass spectrometer
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He22 的首次观察：使用双聚焦质谱仪对 He2 进行电荷剥离
DOI：
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发表时间：
1984
期刊：
影响因子：
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通讯作者：
P. Schleyer
中科院分区：
文献类型：
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作者：
M. Guilhaus;A. Brenton;J. Beynon;M. Rabrenović;P. Schleyer
keV的He 2+的电荷剥离，诱导碰撞与中性靶气体在无场区的质谱仪，被用来搜索的束缚电子态的He 22+，包括地面电子状态。在质谱仪上使用第二个能量分析仪和同位素标记是必要的，以消除两个严重的干扰过程，这两个干扰过程掩盖了电荷剥离过程。当采取这样的预防措施时，观察到一个微弱的信号，作者将其分配给从He2+的X2 Sigma u+状态到X1 Sigma g+状态的转变。
Charge stripping of keV He2+, induced by collision with a neutral target gas in the field-free region of a mass spectrometer, is used to search for bound electronic states of He22+, including the ground electronic state. The use of a second energy analyser on the mass spectrometer and isotopic labelling were necessary to eliminate two severe interference processes which obscure the charge stripping process. When such precautions are taken a weak signal is observed which the authors have assigned to the transition from the X2 Sigma u+ state of He2+ to the X1 Sigma g+ state.