Frequency modulated torsional resonance mode atomic force microscopy on polymers
Frequency modulated torsional resonance mode atomic force microscopy on polymers
复制标题
聚合物的调频扭转共振模式原子力显微镜
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
R. Stark
中科院分区：
文献类型：
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作者：
A. Yurtsever;A. Gigler;C. Dietz;R. Stark
通过频率调制和扭转共振模式原子力显微镜的结合，可以探索聚合物的面内力学。我们研究了一种聚苯乙烯-嵌段-聚丁二烯两嵌段共聚物薄膜。为了更深入地了解图像对比度的形成，我们研究了不同相对分子质量的聚苯乙烯均聚物表面的位移曲线，重点是能量耗散和频移。数据表明，从高度可移动的表层到主体材料的转变取决于聚合物的分子量。这反过来又表明，在成像过程中，尖端在样品表面内轻微摆动。
In-plane mechanics of polymers can be probed by integrating frequency modulation and torsional resonance mode atomic force microscopy. We investigated a thin film of polystyrene-block-polybutadiene diblock copolymer. To gain more insight into image contrast formation, we examined displacement curves on polystyrene homopolymer surfaces of different molecular weights focusing on energy dissipation and frequency shift. Data suggest that the transition from a highly motile surface layer to the bulk material depends on the molecular weight of the polymer. This, in turn, indicates that the tip is slightly oscillating within the sample surface during imaging.