Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy : Their Impact on the Degraded Charge Collection Efficiency
Defects in an Electron-Irradiated 6H-SiC Diode Studied by Alpha Particle Induced Charge Transient Spectroscopy : Their Impact on the Degraded Charge Collection Efficiency
复制标题
通过阿尔法粒子诱导电荷瞬态光谱研究电子辐照 6H-SiC 二极管中的缺陷：它们对电荷收集效率下降的影响
DOI：
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发表时间：
2012
期刊：
影响因子：
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通讯作者：
S. Nozaki
中科院分区：
文献类型：
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作者：
N. Iwamoto;A. Koizumi;S. Onoda;T. Makino;T. Ohshima;K. Kojima;S. Koike;K. Uchida;S. Nozaki
