IMAGING XE WITH A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE
IMAGING XE WITH A LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE
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DOI：
10.1103/physrevlett.66.1189
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发表时间：
1991-03-04
影响因子：
8.6
通讯作者：
LANG, ND
中科院分区：
文献类型：
--
作者：
EIGLER, DM;WEISS, PS;LANG, ND
我们使用低温扫描隧道显微镜 (STM) 获得了 Ni(110) 表面吸收的单个 Xe 原子的图像。 原子-胶体模型已用于计算 STM 成像时 Xe 原子的表观高度，结果与实验结果非常吻合。 我们得出的结论是，Xe 6s 共振虽然接近真空能级，但却是费米能级局域态密度的起源，这使得 Xe 在 STM 中“可见”。
We have obtained images of individual Xe atoms absorbed on a Ni(110) surface using a low-temperature scanning tunneling microscope (STM). The atom-on-jellium model has been used to calculate the apparent height of a Xe atom as imaged with the STM and the result is found to be in good agreement with experiment. We conclude that the Xe 6s resonance, although lying close to the vacuum level, is the origin of the Fermi-level local state density which renders Xe "visible" in the STM.