Highly Accurate Method for Measuring Ordinary and Extraordinary Reflective Indices of Liquid Crystal Materials, Cell Thickness, and Pretilt Angle of Liquid Crystal Cells Using Ellipsometry
Highly Accurate Method for Measuring Ordinary and Extraordinary Reflective Indices of Liquid Crystal Materials, Cell Thickness, and Pretilt Angle of Liquid Crystal Cells Using Ellipsometry
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使用椭圆光度法测量普通和特殊液晶材料反射率、单元厚度和液晶单元预倾角的高精度方法
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
Tatsuo Uchida
中科院分区：
文献类型：
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作者：
Yuji Ohno;Takahiro Ishinabe;Tetsuya Miyashita;Tatsuo Uchida
