Interaction-Free Measurement with Electrons
Interaction-Free Measurement with Electrons
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DOI：
10.1103/physrevlett.127.110401
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发表时间：
2021-09-07
影响因子：
8.6
通讯作者：
McMorran, Benjamin J.
中科院分区：
文献类型：
--
作者：
Turner, Amy E.;Johnson, Cameron W.;McMorran, Benjamin J.
在这里，我们实验证明了使用一种新的电子马赫-曾德尔干涉仪与电子的相互作用自由测量。灵活的双光栅电子干涉仪在传统的透射电子显微镜中构建，并实现了高对比度的离散输出检测器，可调对准与独立可移动的分束器，和扫描成像能力。有了这个路径分离的电子干涉仪，这与理论预期非常匹配，我们证明了电子无相互作用的测量效率为14 +/-1%。在电子成像中实现这种量子协议开辟了一条通往无相互作用电子显微镜的道路。
Here, we experimentally demonstrate interaction-free measurements with electrons using a novel electron Mach-Zehnder interferometer. The flexible two-grating electron interferometer is constructed in a conventional transmission electron microscope and achieves high contrast in discrete output detectors, tunable alignment with independently movable beam splitters, and scanning capabilities for imaging. With this path-separated electron interferometer, which closely matches theoretical expectations, we demonstrate electron interaction-free measurements with an efficiency of 14 +/- 1%. Implementing this quantum protocol in electron imaging opens a path toward interaction-free electron microscopy.