Delta-T noise in the Kondo regime
Delta-T noise in the Kondo regime
复制标题
近藤政权中的 Delta-T 噪声
DOI：
10.1103/physrevb.103.045409
复制
发表时间：
2021
影响因子：
3.7
通讯作者：
Saito Keiji
中科院分区：
文献类型：
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作者：
Hasegawa Masahiro;Saito Keiji
我们研究了SU(2)Kondo量子点在温度偏置下的增量噪声，这意味着在温度偏置下的电荷电流噪声。我们提出了一个实验可测量的量来量化增量噪声中的低温性质，Sℓ=S(TL，tr)−(1/2)[S(tl，tl)+S(tr，tr)]，它给出了非相互作用极限下的散粒噪声表达式。我们计算了SU(2)近藤量子点在粒子-空穴对称情况下的这个量。我们发现，在电化学势偏置和温度偏置的情况下，它们的行为本质上是相同的。定量差异表现为噪声系数的差异，这反映了费米分布函数的差异：电化学势偏置或温度偏置。
We study the delta-noise in the Kondo regime, which implies the charge current noise under the temperature bias for the SU(2) Kondo quantum dot. We propose an experimentally measurable quantity to quantify the low-temperature properties in the delta-noise, Sℓ=S(TL,TR)−(1/2)[S(TL,TL)+S(TR,TR)], which yields the shot noise expression in the noninteracting limit. We calculate this quantity for the SU(2) Kondo quantum dot in the particle-hole symmetric case. We found that theexhibits qualitatively the same behavior in both the electrochemical potential-biased case and the temperature-biased case. The quantitative difference appears as a difference of the coefficients of the noises, which reflects the difference of the Fermi distribution function: electrochemical potential biased or temperature biased.