Small-angle electron scattering in the transmission electron microscope
Small-angle electron scattering in the transmission electron microscope
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透射电子显微镜中的小角电子散射
DOI：
10.1107/s0021889878013886
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发表时间：
1978
影响因子：
6.1
通讯作者：
E. Kenik
中科院分区：
文献类型：
--
作者：
R. Carpenter;J. Bentley;E. Kenik
本文介绍了在透射电子显微镜上进行小角电子散射实验的两种方法：长相机法和选区衍射法。实验表明，几个微弧度和几十分之一毫弧度的角分辨率，分别很容易通过这两种方法获得。一些应用SAES在材料科学中的问题的例子。使用新的高亮度电子源，预计将产生显着增加角分辨率，和使用电子能量分析仪将允许分离的大部分非弹性贡献的SAES强度分布。
Two methods for performing small-angle electron scattering (SAES) experiments in transmission electron microscopes are described: the long-camera-length method and the selected-area-diffraction method. It is shown experimentally that angular resolutions of a few microradians and a few tenths of milliradians, respectively, are easily obtained by these two methods. A number of examples of the application of SAES to problems in materials science are presented. The use of new high-brightness electron sources is expected to produce significant increases in angular resolution, and the use of electron-energy analyzers will permit the separation of most of the inelastic contribution to the SAES intensity distribution.