Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.
Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.
复制标题
一次束能量对 5-30 keV 范围内液体二次电离质谱二次离子溅射效率的影响。
DOI：
10.1021/ac00165a016
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发表时间：
1988
影响因子：
7.4
通讯作者：
Burlingame,AL
中科院分区：
文献类型：
--
作者：
Aberth,WH;Burlingame,AL
用液体二次电离质谱源，在5~30keV的不同Cs+一次束流能量范围内，对等样量的甲基葡萄糖多糖(3514道尔顿)和牛胰岛素(5733道尔顿)的积分离子计数信号进行了比较。结果表明，在以甘油和硫甘油为溶剂基质的正负离子分析模式中，二次离子效率在一次能量超过5keV时迅速增加，在15-20keV时达到最大值，在较高能量时降低。
A comparison Is madeof the Integrated Ion count signals from equal sample amounts of methyl glucose polysaccharide (3514 daltons) and bovine insulin (5733 daltons) obtained by using a liquid secondary Ionization mass spectrometry source at different Cs+ primary beam energies ranging from 5 to 30 keV. Results show that In both positive and negative ion analysis modes with glycerol and thioglycerol as the solvent matrix, secondary Ion efficiency Increases rapidly above 5 keV primary energy, reaches a maximum at 15-20 keV, and decreases at higher energies.