Overlap structure of Fano-resonance profiles of excitons in a semiconductor quantum well
Overlap structure of Fano-resonance profiles of excitons in a semiconductor quantum well
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半导体量子阱中激子法诺共振剖面的重叠结构
DOI:
10.1103/physrevb.64.075318
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发表时间:
2001
影响因子:
3.7
通讯作者:
K. Hino
中科院分区:
文献类型:
--
作者:
K. Hino
The Fano resonance of an exciton in a quantum well of G a A s/A l 0.3 Ga 0.7 As belonging to the Γ 7+-irreducible representation is investigated based on the excitonic 4× 4 Luttinger Hamiltonian. Multichannel scattering problems for the resonance states are solved by virtue of the adiabatic expansion and the R-matrix propagation method, which enable us to implement high-resolution calculations without introducing any empirical broadening parameters. Absorption spectra for excitons are calculated in 100–5 0 0− Å-thick quantum wells, and detailed Fano-resonance profiles for both optically active and inactive exciton states are revealed. Specifically, it is noticed that complicated interference between Fano resonances pertaining to different subbands occurs in a quantum well of more than 350 Å. A resulting composite profile manifests itself as overlap resonance, accompanying marked changes in a peak height, a width, and an asymmetry pattern from the corresponding isolated profiles. Such changes are evaluated qualitatively by use of Fano’s model for one open-channel and two closed-channels. Moreover, quantitative interpretations are also made by employing a time delay given by an eigenphase sum.