Density profile measurement with a heavy ion beam probe in a toroidal plasma of the compact helical system
Density profile measurement with a heavy ion beam probe in a toroidal plasma of the compact helical system
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DOI：
10.1063/1.5039571
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发表时间：
2018-11-01
影响因子：
1.6
通讯作者：
Matsuoka, K.
中科院分区：
文献类型：
--
作者：
Shimizu, A.;Fujisawa, A.;Matsuoka, K.
利用重离子束探针（HIBPs）测量电子密度的可能性已被证明，沿着它们测量电势和磁场的能力。提出了一种重建电子密度分布的方法[A. Fujisawa等人，Rev. Sci.仪器。74，3335（2003）]。在该方法中，通过考虑局部亮度和所谓的路径积分效应（路径积分效应意味着沿束轨道沿着的束衰减效应），将次级束电流的轮廓转换成局部密度轮廓。本文介绍了将所提出的方法首次应用于紧凑螺旋系统等离子体的真实的实验数据后的电子密度分布的HIBP测量。在真实的应用中，根据电子回旋共振加热和中性束注入等离子体的汤姆逊散射测量的电子密度分布，成功地获得了具有足够高的时间分辨率（几ms）的空心密度和峰值分布。出版社：AIP Publishing
A possibility of electron density measurements with heavy ion beam probes (HIBPs) has been demonstrated, along with their capability to measure the potential and magnetic field. A method has been proposed to reconstruct the electron density profile [A. Fujisawa et al., Rev. Sci. Instrum. 74, 3335 (2003)]. In the method, the profile of secondary beam currents is converted into a local density profile by taking into account local brightness and so-called path integral effects which mean the effect of beam attenuation along the beam orbit. Here the article presents the HIBP measurement of the electron density profile after the proposed method was first applied on the real experimental data of compact helical system plasmas. In the real application, the hollow density and the peaked profiles are successfully obtained with sufficiently high temporal resolution (a few ms), in accordance with the electron density profile measured with Thomson scattering for electron cyclotron resonance heating and neutral beam injection plasmas. Published by AIP Publishing.